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MATERIALS for DOWNLOAD
Product sheets, Electrochemistry
Certified reference solutions (CRM) for pH
Product sheets, Length (incl. nano and particle metrology)
Calibration within Length (general overview)
Calibration of roughness meters
Calibration of roughness standards
Calibration of opto-mechanical hole plates
Confocal and interference microscopy
Certified nano particles
Replication for the characterization of hard-to-access surfaces
Measurement of micro-crystals
Microadhesion: Quantification of the adhesion forces of surfaces using AFM
Product sheets, Photonics
PAS technology (photo-acoustic spectroscopy)
RIN measurements (relative intensity noise)
Product sheets, Thermometry
Non-contact (IR) thermometry
SDS – Safety Data Sheet
Reference material 0.01 S/m R03.001
Reference material 0.1 S/m R03.002
Reference material 1 S/m R03.003
Reference material 10 S/m R03.004
Reference material Primary pH buffer ‘Phthalate’ (pH = 4.005) R03.101
Reference material Primary pH buffer ‘1:1 phosphate’ (pH = 6.865) R03.102
Reference material Primary pH buffer ‘1:3.5 phosphate (pH = 7.413) R03.103
Reference material Primary pH buffer ‘Borate’ (pH = 9.180) R03.104
Reference material Primary pH buffer ‘Carbonate’ (pH = 10.012) R03.105
Awarded paper on calibration of UPW (ultra pure water)
“Direct Traceability for Ultra-Pure Water Conductivity” by Hans D. Jensen, DFM
The development of a measurement cell which allows directly traceable measurements of the UPW conductivity.
Nanometrology - an introduction | Poul-Erik Hansen DFM et al.
Why is nanometrology important?
What are the main challenges for nanometrology?
Nanotechnology takes place at the atomic, molecular, meso- and microscopic levels where at least one dimension is below 100nm.
This guide introduces the reader to the science of measurements at the nanoscale, that is nanometrology.